Gate Stack Technology

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

VSP - A gate stack analyzer

An efficient software tool for investigations on novel stacked gate dielectrics with emphasis on reliability has been developed. The accumulation, depletion, and inversion of carriers in MOS capacitors is properly considered for nand p-substrates. The effect of carrier quantization on the electrostatics and the leakage current is included by treating carriers in quasi-bound states (QBS) and con...

متن کامل

High-K dielectrics for the gate stack

This article gives an overview of recent developments in the search for the next-generation dielectric for the complementary metal-oxide semiconductor gate stack. After introducing the main quantities of interest, the paper concentrates on a figure of merit that connects two main properties of the gate stack, namely, the leakage current and the capacitance. This is done for single layers as wel...

متن کامل

Thermodynamic-RAM Technology Stack

We introduce a technology stack or specification describing the multiple levels of abstraction and specialization needed to implement a neuromorphic processor (NPU) based on the previously-described concept of AHaH Computing and integrate it into today’s digital computing systems. The general purpose NPU implementation described here is called Thermodynamic-RAM (kT-RAM) and is just one of many ...

متن کامل

Challenges for Atomic Scale Modeling in Alternative Gate Stack Engineering

We review the challenges for atomic scale modeling of alternative gate dielectric stacks. We begin by highlighting recent achievements of state-of-the-art atomistic simulations of the Si/SiO2 system, showing how such calculations have elucidated the microscopic origins of several important experimental phenomena. For the benefit of readers who may be unfamiliar with the simulation tools, we ove...

متن کامل

Transmission Coefficient Estimation for High-κ Gate Stack Evaluation

We investigate methods to estimate the transmission coefficient of high-κ gate stacks. Based on the commonly used Tsu-Esaki model, we approximate the WKB and Gundlach methods to be feasible for device simulators. Comparisons with a rigorous solution using the transfer-matrix method show good qualitative agreement. We further use the models to analyze the trade-off between barrier height and per...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Hyomen Kagaku

سال: 2012

ISSN: 0388-5321,1881-4743

DOI: 10.1380/jsssj.33.600